IEEE EMC Society Huntsville Chapter

IEEE
January 7th, 2013

Technical Meeting

Which is Better: Use One Value Capacitor or Three Different Values for the Power Distribution Network?

… and why this is the wrong question.

Speaker:

Dr. Eric Bogatin, Bogatin Enterprise

Author, Worldwide Lecturer, Signal Integrity Evangelist

Meal Sponsor:

Peter O’Brien,  Teledyne LeCroy


Pulled Pork, BBQ Chicken Quarters, Baked Beans, Corn on the Cob, Cole Slaw, Buns/Rolls
Dessert – Peach Cobbler

Sweet/Unsweet Tea and Water

Meeting Location: Adtran, Mark C. Smith Conference center. East Tower, Training Room 273

The Huntsville Chapter of the IEEE Electromagnetic Compatibility (EMC) Society invites you to attend a Technical Meeting on January 10, 2013 featuring a talk given by Dr. Eric Bogatin.  The program will begin at 5:30 pm with  Peter O’Brien of Teledyne LeCroy sponsoring a free catered meal.  Dr. Bogain’s technical presentation will begin at approximately 6:20 pm after some short chapter status updates.

Dr. Eric Bogatin is in Huntsville teaching several classes at the NASA MSFC campus and are open to the public, and has graciously offered to give a technical presentation to our local Chapter while he is in town. For more information on the classes please go to  http://www.beTheSignal.com.

Synopsis:

We often hear the guideline of use three different capacitor values rather than a single value. Is this good advice? Of course the answer is, “…it depends”. In this presentation, I illustrate the analysis path we take to explore this answer.
Bio:
Dr. Eric Bogatin is currently a Signal Integrity Evangelist with Bogatin Enterprises, where he teaches advanced signal integrity classes world-wide. He received his BS degree in physics from MIT in 1976, and MS and PhD degrees in physics from the University of Arizona in Tucson in 1980. He has held senior engineering and management positions at Bell Labs, Raychem, Sun Microsystems, Ansoft, and Interconnect Devices. Eric has written six books on signal integrity and interconnect design and over 300 papers. Many of these are posted for free download at www.beTheSignal.com. His latest book “Signal and Power Integrity-Simplified” was published in 2009 by Prentice Hall. Read his blog at www.beTheSignal.com/blog and follow him on twitter @beTheSignal.

 

The meal and presentations are open to anyone interested in EMC or Circuit Design: IEEE membership is not required to attend.

 


January 7th, 2013

The meal and presentations are open to anyone interested in EMC. IEEE membership is not required to attend.
Seating is limited to the first 75 people registered.

You must Register at https://meetings.vtools.ieee.org/meeting_view/list_meeting/15929 as soon as you can, but no later than 1:00 p.m. CST, 01/08/13.

Note: If you are not an IEEE member or do not have your IEEE Membership Number please just leave that portion of the form blank.  The main items we need for your registration are your name and email address.


January 7th, 2013

The Huntsville EMC Chapter of the IEE E EMC society would like to issue the call for presentations for the 2013 meeting year.

Presentations are needed for five monthly technical meetings on the following dates:

• 21 February 2013
• 18 April 2013
• 16 May 2013
• 15 August 2013

Topics in all areas of EMC are welcome. We devote an hour for the technical presentation.  An LCD computer projector is available.

If you are interested in presenting at one of these meetings, please email your presentation topic(s) and a short summary of each topic to Thomas Perry by close of business 11 January 2013. If your presentation charts are already put together, please send them along with the topic and summary.

Contact Thomas Perry

 


November 6th, 2012

Free Education Opportunity – MIL-STD 461/464  Presented by Rohde & Schwarz  

Date:  November 9, 2012
Time:  9:00am – 2:00pm   Lunch will be provided
Location:  Wyle Labs

Advances in MIL-STD 461/464 Testing w/ Ken Javor

With the increased integration of embedding computing and wireless technologies into modern military systems, the need for mission success has put more emphasis on electromagnetic compatibility assurance. This class will give a brief overview of the MIL-STD 461/464 test requirements and offer a historical perspective of the testing and how it has evolved to meet the modern challenges of defense electronics test and integration. Insight into the direction of future proposed changes MIL-STD’s will be be presented along with some initial insight to test correlation of the results

Registration Info:

Please select “A9402C” when registering at www.rohde-schwarz-tour.com/registration

About the Speaker – Ken Javor

Ken Javor has worked in the EMC industry for thirty years. He is a consultant to government and industry, runs a pre-compliance EMI test facility, and curates the Museum of EMC Antiquities, a collection of radios and instruments that were important in the development of the discipline, as well as a library of important documentation. Mr. Javor is an industry representative to the Tri-Service Working Groups that write MIL-STD-464 and MIL-STD-461. He has published numerous papers and is the author of a handbook on EMI requirements and test methods.


October 2nd, 2012

Technical Meeting

Convincing Digital Designers

Speaker:

Dr. Howard Johnson, Signal Consulting, Inc.

Author, EDN Magazine Columnist, Worldwide Lecturer

Meal Sponsor:

Huntsville IEEE EMC Society

Pizza and Soda

Meeting Location: UAHuntsville Shelby Center Room 107

The Huntsville chapter of the IEEE Electromagnetic Compatibility (EMC) Society invites you to attend a technical meeting on 10/4/2012. The program will begin at 5:30 p.m. with the Huntsville IEEE EMC Society sponsoring a Free Pizza dinner in the courtyard area (weather permitting.)  Food and drinks will not be allowed in the Auditorium; thus, please plan accordingly to allow enough time to eat prior to convening into the Auditorium.  Dr. Johnson’s presentation will start at approximately 6:10 pm, after some short chapter status updates.

Dr. Johnson is making his last trip to Huntsville before retiring.  He is teaching his “High Speed Noise and Grounding” class on October 4 and 5th and has graciously accepted our invitation to give a presentation at our IEEE EMC Society meeting.  For more information on the class go to http://www.sigcon.com/seminars/seminarHSNG.htm.

 

Synopsis:

Dr. Johnson’s talk, titled “Convincing  Digital Designers,” is based on his  highly entertaining film, “Path of RF  Current,”  and article, “Visible  Return Current.”  The film is directed towards those engineers that doubt  whether the shape and location of a returning signal conductor could  possibly  affect a high-frequency circuit — an old argument you have surely re-enacted  many times with your digital colleagues.

The meeting will be held at UAHuntsville in the Shelby Center’s Room 107. The directions are included on page 2.  Parking is provided on the South side of the Shelby Center.

The meal and presentations are open to anyone interested in EMC or Circuit Design: IEEE membership is not required to attend.

 

Seating is limited to the first 190 who register, so you must Register at https://meetings.vtools.ieee.org/meeting_view/list_meeting/14555 as soon as you can, but no later than close of business 10/3/2012.  

Note: If you are not an IEEE member or do not have your IEEE Membership Number please just leave that portion of the form blank. 

Each Registrant will receive a confirmation email.

You don’t want to miss this rare opportunity!  I hope to see you there!

Lon Brolliar

Chair,HuntsvilleChapter  IEEE EMC Society

Huntsville EMCS website: http://ewh.ieee.org/r3/huntsville/emc/

 

 

 


September 10th, 2012

The Huntsville chapter of the IEEE Electromagnetic Compatibility (EMC) Society invites you to attend the 2012 Technical Distinguished Lecturer Meeting on September 20, 2012. The meeting will be held at ADTRAN in the North Tower, Bridge Training Room. The program will begin at 5:30 pm with Gary Ziadeh – Brennan Associates and Robert Rowe – AR sponsoring a free catered meal. Colin Brench’s technical presentation will begin at approximately 6:20 pm.

Sponsor:

Gary Ziadeh of Brennan Associates and Robert Rowe from AR

“South of the Border”

Chicken Fajitas; Beef Hard & Soft Shell Tacos with Sour Cream/Jalapenos/Shredded Lettuce/Tomatoes
on the side;
Tortilla Chips; Cheese and Salsa; Re-fried Beans; Churros
for Dessert; Sweet/Unsweet Tea and Water

Presentation Topic:

“Antenna Behavior for EMC Engineers (What really goes on during a test?)”

Synopsis:
Practical EMC Engineering is intimately tied to antenna effects.  There are two primary areas of interest, measurement antennas and incidental antennas; those we design and expect to behave in a predictable manner and those that ‘naturally occur’ and whose behavior is less predictable.  This presentation will provide insight into both areas to enable better understanding of the many antenna issues that are part of everyday EMC engineering.

Antennas are fundamental to EMC measurements; however, the subtleties of their behavior and use for these measurements are often not fully understood.  This presentation provides a detailed look at antennas as used by EMC engineers for making compliance tests and evaluating the performance of a test site.  Examples will be given showing how different antennas behave under the same test conditions.  In today’s EMC test standards such as C63.5, antenna behavior is addressed; however the significance is not obvious to the casual user.  The value of these standards in improving the accuracy of EMC compliance testing and site validations will also be discussed.

Without the incidental antenna effects of a device under test there would be no radiated emissions to cause concern.  Therefore, it is necessary to understand how a device, or system, can function as an antenna.  To demonstrate this behavior a series of simulation videos will be presented that show current distributions and field patterns associated with realistic incidental antennas.


September 9th, 2012

The meal and presentations are open to anyone interested in EMC. IEEE membership is not required to attend.
Seating is limited to the first 100 people registered.

You must register at https://meetings.vtools.ieee.org/meeting_view/list_meeting/14091 as soon as you can, but no later than 1:00 p.m. CST September 18, 2012.

Note: If you are not an IEEE member or do not have your IEEE Membership Number please just leave that portion of the form blank.  The main items we need for your registration are your name and email address.


August 21st, 2012
  • How do you calculate the diff mode and common mode inductance for filters to meet MIL-STD-461 conducted emission spec on a 28 VDC line?
  • What are typical differences between an military standard evaluation for airborne equipment and an evaluation for NASA?
  • Please explain the results at the IC pin interface one is trying to achieve when apply ESD protection circuitry. Is it limiting the voltage at the IC to a maximum voltage and if so what is that voltage (e.g. Is it the part’s absolute maximum voltage for that pin, a percentage above the absolute maximum?, etc.) or is it just a circuit survivability test (i.e. Whether or not the protection is adequate is determined by empirical data.)
  • Can you describe an EMI/EMC test where the procedures and/or results had a unexpected/surprising outcome? Did this (or could this) experience lead to a revision to the test standards?
  • Do you see areas where test standards need to be revised to keep up with changes in technology?
  • Which MIL-STD-704F tests (TAC & LDC) apply to a ground power unit supplying 115 VAC, 400 Hz, 3 cycle power and 28 VDC to an aircraft?
  • From the EME/EMI perspective, what is the life cycle of a piece of equipment? Is there a time in the life cycle that the requirements would change or have to be re-verified?
  • How would you check a bonded joint to have a resistance of less than ‘X’ Ωs during the design phase of a system. That is to say how would you calculate the resistance and what information would you use?
  • What is the evolution of 2.5 mΩ as the “golden standard” for RF bonding Where did it come from?
  • Given the reliance on 2.5 mΩ as the “golden standard” for RF bonding does it really give any indication of bond performance?

July 31st, 2012

The Huntsville chapter of the IEEE Electromagnetic Compatibility (EMC) Society invites you to attend a technical meeting on August 23, 2012. The meeting will be held at ADTRAN in the North Tower, Bridge Training Room. The program will begin at 5:30 pm with George Bollendorf of Advanced Test Equipment Rentals, sponsoring a free catered meal.  The roundtable discussion will begin at approximately 6:20 pm after some short chapter status updates.

Meal Sponsor:

George Bollendorf

Advanced Test Equipment Rentals

 “Italian Station”

Classic Lasagna, Chicken Alfredo, Salad, Breadsticks, Roasted Zucchini & Squash, Cheesecake Dessert, Sweet/Unsweet Iced Tea and Water.

 

Presentation Topic:

“Roundtable Discussion of EMC Topics”

For the August technical meeting the chapter is trying something new.  The meeting will be a roundtable discussion, where the chapter members can ask questions to the panel.

 

The Panel will consist of:

  • Ken Javor – MIL Standard/General EMC
  • Glenn Shelby – MIL Standard/NASA EMI/EMC Testing
  • Tim Travis – MIL Standard EMI/EMC Testing
  • Paul Stover – Commercial EMI/EMC Testing (including ESD)
  • Brian Smith – Military EMI/EMC ( including Bonding/Grounding)

 

If you have a question(s) for one of the panel members, please submit your question at http://ieee.fluidsurveys.com/s/hsv-emc-aug/ by August 15, 2012.  All questions will be posted here.


July 30th, 2012

The meal and presentations are open to anyone interested in EMC: IEEE membership is not required to attend. Seating is limited to the first 100 who register.

You must Register at https://meetings.vtools.ieee.org/ as soon as you can, but no later than noon on 8/21/2012.

Note: If you are not an IEEE member or do not have your IEEE Membership Number please just leave that portion of the form blank.  The main items we need for your registration are your name and email address.