Co-sponsored by: IEEE NPSS, Harry Sauberman (chair)

Space and Nuclear radiation has major disruptive effects on electronic device operation and reliability, not only in space, but also for avionic and terrestrial applications. Single Event Effects (SEE) caused by a single charged particle presents a major challenge especially for scaled technologies. In this talk we will review operational environments, the effect of various radiation sources on device operation and reliability, and approaches to mitigate radiation effects. We will also discuss the effects of technology scaling, and unique mechanisms affecting scaled devices that were negligible in older technologies.

Nadim Haddad is an IEEE Fellow and a member of EDS and NPSS. He is serving as Chair, Nanotechnology Council Chapter of Northern Virginia and DC, and as Director of IEEE Northern Virginia Section. Nadim received his BA in Physics and Mathematics from Kansas Wesleyan University and his MSEE from Michigan State University. He was instrumental to the development of nine generations of radiation hardened technology and products in support of military, civil and commercial applications at IBM, Loral, Lockheed Martin and BAE Systems. He retired from IBM as a Sr. Technical Staff Member and from BAE Systems as Technical Director and Engineering Fellow. After retirement, he served as a Term Engineer at Vanderbilt University. He authored or co-authored over 100 publications and is credited with 26 inventions. He is recognized in Marquis Who’s Who in America, Who’s Who in Science and Engineering and Who’s Who in the World.

Speaker(s): Nadim Haddad,

Agenda:

6:00 Light dinner and Networking Opportunity
6:30 Distinguished Lecture

Location:
Room: 3rd Floor Conference Room
TeqCorner
1616 Anderson Rd
McLean, Virginia
22102