EMC Society – Orange County Chapter

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March 20th, 2017


Chairman – Homi Ahmadi
Vice Chairman – Charlie Bayhi
Secretary – Tom Ha
Treasurer – Paul Herrick
Program Chair –


See our website (http://ewh.ieee.org/r6/ocs/pses/) for Agenda,  and map of location
RSVP by 5PM, March 27, 2017

(Open to all – you do not need to be a member of IEEE)
+ FREE FOOD!!!!!

(Provided by Northwest EMC)
Tuesday, March 28 @ 6 PM


Northwest EMC

41 Tesla

Irvine, CA 92618

PRESENTER – Jeffrey D. Lind is President of Compliance West USA

Jeffrey D. Lind is President of Compliance West USA, a manufacturer of product safety testers since 1997.


Lind launched is career in the electrical product safety industry working at Underwriters Laboratories (UL) from 1976-1982 doing project engineering and follow up services management. He then lent his skills to Atari™ as a product safety engineer for a year. Shortly after moving to San Diego in 1983 to work with Sega Gremlin™, Lind decided to branch out on his own and launched Compliance West.


Originally a consulting company that helped companies secure product safety approvals, Compliance West evolved into the business of building and selling the test equipment after selling the consulting portion of the business to Nemko. Soon, the company branched out into Surge Test Equipment, offering testers for EN60950, the international Data Processing safety standard; and growth into the medical industry followed with the release of the popular Defib-5 defib-proof tester. Contributions from industry have improved the testers over the years, and Compliance West has updated equipment to follow industry requirements.


Lind received his Bachelors of Science in electronic engineering from Cal Poly San Luis Obispo in 1976. A former downhill bicycle racer, Lind enjoys biking and and camping with his 13–year old twin sons.


PRESENTATION – “Capacitive Discharge Testing”

–        Abstract:

–        Discuss Background of test

–        History of how it has been conducted

–        “Unplug and hope”

–        Discussion of accuracy of test: scopes vs. DSH 251e vs. capacitor discharge test measurement on scope Discussion of automated methods Show interesting results

–        Power on vs. standby

–        Switching power supply :not disconnecting at peak”

–        Difference between hot-ground and neutral-ground results

–        Need to conduct the test ten times to get proper results even when always disconnecting at the peak.

March 15th, 2017

Get the Latest on RED and CE Marking Directives + an Update on 60601-1-2 4th ed.

Join Element and your local OC EMC Chapter for a complimentary half-day seminar!

Seminar will address:

  • Major changes with the Radio Equipment Directive (RED)
  • CE Marking Directives
  • An update on 60601-1-2 4th edition

​We will also provide an introduction to our latest service offering, Product Safety testing.

With the imminent deadline for RED fast approaching, this seminar will cover the most important legislative changes in Radio, CE Marking and Safety testing, discussing best approaches to compliance.

The seminar will feature Element’s engaged experts from Element UK, and Greg Kiemel from Element US.

For more information and to register for this event, please click on the following link:



October 21st, 2016


Chairman – Homi Ahmadi
Vice Chairman – Charlie Bayhi
Secretary – Tom Ha
Treasurer – Paul Herrick
Program Chair –


See our website (http://ewh.ieee.org/r6/ocs/pses/) for Agenda,  and map of location

RSVP by 5PM, October 24, 2016

(Open to all – you do not need to be a member of IEEE)
+ FREE FOOD!!!!!

(Provided by Northwest EMC)
Tuesday, October 25 @ 6 PM


Northwest EMC

41 Tesla

Irvine, CA 92618


        • PRESENTER – Rick Candelas, Extron Electronics (Compliance Engineer)
          • Rick Candelas has over 16 years of experience in the EMC industry.  He has extensive experience in both the commercial test lab environment and the manufacturing side of testing.  In the commercial test lab he managed every aspect of testing, test equipment, procedures, standards, quality assurance, project management and customer interaction.  He has worked with many in-country agencies to achieve certification of units under test and accreditation bodies to achieve ISO 17025 certification of the test lab.  Since joining Extron Electronics, Rick has been instrumental in keeping the internal Safety and EMC lab ISO 17025 accredited.

          –        From organizing a test plan and evaluating potential test points that will cause degradation or damage to the unit under test.-        What will be the pass/fail criteria for your product?-        What documentation is needed to show compliance?

        • –        Will an accredited lab be used or will this be done in-house.
        • –        Understanding the standard.  We will focus on IEC 61000-4-2.
        • PRESENTATION – This presentation will focus on how to be better prepared for ESD testing.

October 18th, 2016


A Joint Meeting of the Los Angeles, Orange County, and San Diego EMC Chapters Held in Conjunction with the ANSI ASC C63® Committee Meeting


Power versus Field:  A Novel Approach to Immunity Testing above 1 GHz
By Vic Hudson, Director – EMC Solutions, ETS-Lindgren, Cedar Park, Texas

Based on the latest version of ANSI C63.4a – Is there any value to do NSA validation above 2 meters?
By Dean Ghizzone, General Manager, and Greg Kiemel – Director of Engineering – Northwest EMC Inc.


Date:              Monday, November 7, 2016

Time:               5:30 pm social hour, 6:00 pm dinner, 7:00 technical program

Venue:            Northwest EMC, 41 Tesla Ave., Irvine, CA 92618 (949) 861-8918
View a Google map of the Irvine, CA facility  – Hotels near Irvine Facility

RSVP:              Alee Langford – Reserve by October 31st to ensure there is adequate seating/dinner




PARKING:        Please park in the Northwest EMC designated parking areas.


Presentation 1:

Abstract:  An EMField generator is shown as a novel, integrated solution for radiated immunity testing, including IEC 61000-4-3.  The novel solution combines an amplifier, directional couplers, and an antenna array into one simplified and compact design to support fully compliant testing.  It is shown that virtually all of the generated power is converted into useable field strength.  The presentation includes a review of theory, design concept, functionality, setup configuration, main applications and more.  A live demonstration of the material presented will be held at the conclusion of the technical program using the Radiated Immunity Chamber at Northwest EMC.

Presentation 2:  draft ANSI C63.4a/D1.01 adds ideal NSA values for 2.5m vertical and 3m horizontal to Annex D.  The change provides a means to validate test volumes greater than 2m in height. This presentation will discuss the comparative measurements that were made to see if there is any reason to validate a test volume greater than 2 meters in height.

Speaker Biographies:

Vic Hudson has worked as the Director of EMC Solutions at ETS-Lindgren, Cedar Park, Texas for the past six years. He has been involved in the EMC industry for nearly 20 years. Vic’s background includes application support, software development, system design, and project management. He has written articles and papers for Evaluation Engineering and In Compliance magazines. Vic graduated with a BSEE from Southern Illinois University-Carbondale in 1985.

Dean Ghizzone is the Founder and General Manager of Northwest EMC.  He is active in ANSI ASC C63® and has more than 28 years’ experience in product testing for EMC compliance.  He has been published in various technical journals.  Prior to his many years with Northwest EMC, he worked as an EMC engineer at Tektronix, Inc.  Dean earned his BS degree in Engineering from Weber State University and is a Senior Member of the IEEE.  

Greg Kiemel is the Director of Engineering at Northwest EMC. Greg has been instrumental in the development of wireless testing, product certification, and global approvals capabilities at Northwest EMC.  With more than 30 years of EMC experience, Greg is an iNARTE-certified EMC and ESD engineer, Master EMC Design Engineer, as well as a certified Wireless Device Certification Professional. He is active in ANSI ASC C63, and served as Chair of the TCB Council. Greg is a Senior Member of the IEEE, completing a two-year term as a Distinguished Lecturer.

August 30th, 2016

Recent Developments in EMC Design and Test for
Improved Measurements and Performance Evaluation

This is a free seminar, but you must register IN ADVANCE
no later than Friday, September 9 to ensure adequate seating and catering. The Toyota Automotive Museum exhibits are also available for viewing at no charge to IEEE seminar attendees.

Date: Tuesday, September 13, 2016

Time: 3:00 pm – 3:30 pm Registration
3:30 pm – 6:15 pm Presentations, including a break between speakers
6:15 pm – 7:00 pm Refreshments with speakers; tour of museum exhibits

Location: The Toyota Automotive Museum, 19600 Van Ness Ave., Torrance, CA 90501
Museum Phone: 310-468-8726, Website: www.toyotausamuseum.com
See map for directions. There is plenty of free parking near the entrance to the museum.

RSVP: Contact Eric Hahn with Altamont Technical Services at (858) 472-7666 or email eric@atsemc.com for more information and to RSVP. You can also reserve on line – SEE LINK BELOW. SPACE IS LIMITED – RESERVE EARLY TO SAVE YOUR SPACE!!!


Please click here for details on speakers and more information. More Information

January 18th, 2016

The IEEE Orange County EMC chapter would like to share with its members the following information.

Rohde & Schwarz is hosting complimentary seminars with Lee Hill around EMI troubleshooting. These events are held at 5 locations in the US during March 2016. Please see link for more information on how to register for these events.

Rohde & Schwarz Seminars

September 16th, 2015

There is a one-day EMC “Mini-Symposium” planned for the LA/Irvine area – It is scheduled for Sept 22nd. Lunch and a cocktail hour are included. Four professional EMC speakers are on the agenda including a closing “Ask the Experts” round-table type session.

For this EMCmini Event Series, you will learn simplified key principals that will help you guide your company and your team to achieve EMC product compliance, and fix EMC problems minimizing project cost and schedule impact.

The four speakers each have a minimum of 35 years experience from multiple industries. Each are highly knowledgeable and respected within the EMC engineering community. They will teach you about relevant standards and regulations as well as a review of the basics of product testing for EMC compliance.

You will also learn about basic EMC theory without a focus on complex math.

The exhibitors provide as vast array of solutions for shielding materials, test equipment, EMC chambers, diagnostic tools, EMC simulations, etc.

For further details and to register, please visit: http://emcmini.us/

September 3rd, 2015

Recent Developments in Antenna and RF/Microwave Testing for Improved Measurements and Performance Evaluation

This is a free half-day workshop, but you must register IN ADVANCE no later than Thursday, September 10 to ensure visitor access at Boeing

Date: Thursday, September 17, 2015
Time: 1:00 pm – 2:00 pm Registration and complimentary lunch courtesy
of the Los Angeles IEEE EMC Chapter
2:00 pm – 4:00 pm Presentations, including a break between speakers
4:00 pm – 4:30 pm Refreshments with speakers
Location: The Boeing Company, 5310 Bolsa Ave, Huntington Beach, CA 92647
Bldg. 28, The Boeing Conference Center (visitors should park in front of Building 28, Lot B1).
See map.
RSVP: Contact Phil Strong with Altamont Technical Services at office 909-460-1861, cell 909-214-9572 or
email pastrong@atsemc.com for more information and to RSVP. SPACE IS LIMITED – RESERVE EARLY TO SAVE YOUR SPACE!!! All attendees must provide their full name, organization name, telephone number, US citizen status (if not US, please provide country of citizenship) and email address in order to have a Boeing badge visitor badge ready for you upon arrival. RESERVATIONS MUST BE MADE BY THURSDAY, SEPTEMBER 10.
ID NEEDED: Upon arrival at Boeing, all visitors must present a government issued photo ID – driver license
and/or passport – to obtain your Boeing visitor badge upon arrival – NO EXCEPTIONS

More information and technical program details can be found here:

Boeing Huntington Beach Map

IEEE Huntington Beach Chapter Meeting – Sept 2015

June 1st, 2015

VDE Americas is hosting two events next week that may be of interest to you on Regulatory Compliance Strategies and Solutions for Wireless Enabled Products Sold Globally. One of the events is located in Costa Mesa, California.

Please see the following links:

Santa Clara, CA June 9, 2015

Costa Mesa, CA June 11, 2015

If you are interested in these events, please register directly via the links provided.

May 29th, 2015

Tuesday June 2nd, 2015, 6pm-8pm

IEEE San Diego Section Talk

Using an Automated Near-Field Solution to Approximate Resonant Far Field Values

Dinner Date/Time:  Tuesday June 2nd, 2015, from 6 – 8pm PST


Traditional methods for establishing EMC and field density can be predicted using a field approximation routine based on well documented principles. In the process of reducing spurious emissions or interference EMC engineers will use suppression techniques of shields, boxes and cages. These methods have been found to work in normal applications but as the frequency expands traditional methods of EMC suppression may not be as effective. Key to timely development of product is to be able to establish what fields may cause signal integrity problems or resonances which will impact certification, being able to determine evanescent or resonant modes can reduce demand on far field chambers and expedite problem solving at the bench. The far field approximation technique presented allows an engineer to test a sub assembly in the near field and then have a value which can be extrapolated to the far field. Measurements taken using the broadband near field “magnetic probe method” used with an automated scanning system (EM-ISight) can be extrapolated to either a 3m or 10m range space. Such a technique can allow the design engineer to determine the effectiveness of their design prior to the final integration of an assembly thus understanding better the uncertainties of a previously developed reference design or suppression methods. 
Stuart Nicol, Aprel (CEO)

Stuart Nicol has worked within the field of high technology/telecommunications for over 16 years both in Europe and North America. He has been the lead in all major automated system development programs at APREL including SAR (Specific Absorption Rate). HAC (Hearing Aid Compatibility) and EM-ISight (near field scanning). He has held many positions within the international standards development committees and is the current chairman for the Canadian delegation of IEC TC-106, he received his degree in the United Kingdom (electronic and manufacturing engineering) and is the CEO of APREL

Jesse Hones,

Jesse Hones, is the Senior Design Engineer and Team Leader for the EM-ISight System and the Team Leader for Far Field Approximation module in the EM-ISight Near Field scanning system.  He is the Manager of Engineering Systems at APREL. In 2014, he was a keynote speaker at the International Standards Laboratory (ISL) Automotive Seminar in Taiwan.  He has earned an Honors Bachelor of Science in Engineering Degree, Engineering Systems and Computing, from the University of Guelph, 2005, and a Computer and Information Science Minor Degree, from the University of Guelph.  He is a member of the IEEE organization, and a member of the Professional Engineers of Ontario, Canada.


Advanced Test Equipment Corp, Training Center
10401 Roselle St. San Diego, CA 92121


    Start @ 6:00pm
  – 30 min Social Dinner & Networking
  – 10 min Intro & housekeeping
  – 60-90 min feature presentation/topic
  – 5 min wrap-up

This meeting is free to attend and dinner is provided.


Seating is limited to 45 attendees, please RSVP using the link below:

Questions:  see galcala@atecorp.com