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Posts Tagged ‘San Diego’

Sharing IEEE San Diego Section Meeting Details

Friday, May 29th, 2015

Tuesday June 2nd, 2015, 6pm-8pm

IEEE San Diego Section Talk

Using an Automated Near-Field Solution to Approximate Resonant Far Field Values

Dinner Date/Time:  Tuesday June 2nd, 2015, from 6 – 8pm PST

Topic:

Traditional methods for establishing EMC and field density can be predicted using a field approximation routine based on well documented principles. In the process of reducing spurious emissions or interference EMC engineers will use suppression techniques of shields, boxes and cages. These methods have been found to work in normal applications but as the frequency expands traditional methods of EMC suppression may not be as effective. Key to timely development of product is to be able to establish what fields may cause signal integrity problems or resonances which will impact certification, being able to determine evanescent or resonant modes can reduce demand on far field chambers and expedite problem solving at the bench. The far field approximation technique presented allows an engineer to test a sub assembly in the near field and then have a value which can be extrapolated to the far field. Measurements taken using the broadband near field “magnetic probe method” used with an automated scanning system (EM-ISight) can be extrapolated to either a 3m or 10m range space. Such a technique can allow the design engineer to determine the effectiveness of their design prior to the final integration of an assembly thus understanding better the uncertainties of a previously developed reference design or suppression methods. 
 
Speaker: 
Stuart Nicol, Aprel (CEO)

Stuart Nicol has worked within the field of high technology/telecommunications for over 16 years both in Europe and North America. He has been the lead in all major automated system development programs at APREL including SAR (Specific Absorption Rate). HAC (Hearing Aid Compatibility) and EM-ISight (near field scanning). He has held many positions within the international standards development committees and is the current chairman for the Canadian delegation of IEC TC-106, he received his degree in the United Kingdom (electronic and manufacturing engineering) and is the CEO of APREL

Jesse Hones,

Jesse Hones, is the Senior Design Engineer and Team Leader for the EM-ISight System and the Team Leader for Far Field Approximation module in the EM-ISight Near Field scanning system.  He is the Manager of Engineering Systems at APREL. In 2014, he was a keynote speaker at the International Standards Laboratory (ISL) Automotive Seminar in Taiwan.  He has earned an Honors Bachelor of Science in Engineering Degree, Engineering Systems and Computing, from the University of Guelph, 2005, and a Computer and Information Science Minor Degree, from the University of Guelph.  He is a member of the IEEE organization, and a member of the Professional Engineers of Ontario, Canada.

 

Location:
Advanced Test Equipment Corp, Training Center
10401 Roselle St. San Diego, CA 92121
https://goo.gl/maps/SY6hk

Agenda:

    Start @ 6:00pm
  – 30 min Social Dinner & Networking
  – 10 min Intro & housekeeping
  – 60-90 min feature presentation/topic
  – 5 min wrap-up

Cost:  
This meeting is free to attend and dinner is provided.

Registration:  

Seating is limited to 45 attendees, please RSVP using the link below:
https://meetings.vtools.ieee.org/meeting_registration/register/34830

Questions:  see galcala@atecorp.com