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2018 IEEE 27th North Atlantic Test Workshop (NATW)

May 7 @ 9:00 am - May 9 @ 5:00 pm

IEEE sponsors:

  • Green Mountain Section
  • IEEE USA Washington, DC
  • Region 01- Northeastern USA

The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. In addition to traditional topics, the 27th NATW will feature a general theme of “Sillicon Photonics.” Topics are not limited to, the following: Analog, Mixed Signal and RF Testing, Built-In Self-Test (BIST), Board Level Testing, Delay and Performance Testing, Design Verification/Validation, Diagnosis and Debug, Fault Modeling/Simulation, FPGA and Embedded Core Testing, IDDQ Testing, DFM, Defect Analysis and Defect-Based Testing, Memory and MEMS Testing, Nanotechnology Testing, Online Testing, System-on-Chip (SoC) Test and Debug/Test Quality and System Reliability.

Agenda:

Conference Details

Dates
07 May – 09 May 2018

 
Location
Essex Resort & Spa
70 Essex Way
Essex, VT, USA

 

Web site
natw.ieee.org

 

Contact
Ted Cooley
236 Dame Hill Road
Orford NH USA 03777
603-353-9325
603-398-4349
escooley03@gmail.com

Location:
Essex Resort & Spa
70 Essex Way
Essex, Vermont
05452

Details

Start:
May 7 @ 9:00 am
End:
May 9 @ 5:00 pm
Event Category:
Website:
http://events.vtools.ieee.org/m/160633

Venue

City: Essex

IEEE Region 1 Website