Month: April 2017
“On the Relationship between Nyquist Rate and Healthcare: Silicon Systems to Close the Sub-Sampling Gap in Health Screening and Monitoring” by Prof. Amin Arbabian, Stanford University
IEEE SCV CAS proudly co-sponsors the IEEE Santa Clara Valley Solid States Circuits Society upcoming technical talk on Thursday April 20, 2017 by Prof. Amin Arbabian, Stanford University with the title of:… Read more