Co-sponsored Events
IEEE Heterogeneous Integration Roadmap (HIR) sponsored by three IEEE Societies (EPS, Photonics, EDS) together with SEMI and ASME EPPD
Date: Thursday, February 22, 2018
Time: 8:30 AM to 6:00 PM
Cost: $40 IEEE members. students, unemployed, $50 non-members ($10 more, after Feb. 9th)
Location: Texas Instruments Building E Conference Center, 2900 Semiconductor Dr. (off Kifer Rd), Santa Clara
Reservations: 1802symp-eps.eventbrite.com
Information and Registration page:
http://www.cpmt.org/scv/?p=513
Co-sponsored Events: |
November 2017:
Date: Tuesday, November 7, 2017 Registration: 9th Annual IEEE CPMT SCV Soft Error Rate (SER) Workshop – SCV Chapter, IEEE CPMT Society EDS/EPS/Reliability Chapter Workshop |
July 2017 |
July 20th, 2017 | Energy Efficient Computing in Nanoscale CMOS
Sponsored by: IEEE Santa Clara Valley Solid State Circuits Society, Co-sponsored by IEEE Electron Devices Society SCV Chapter Time: July 20th, 2017, 6:00 PM to 8:00 PM Speaker: Dr. Vivek De, Intel Fellow and Director of Circuit Technology Research at Intel Labs Location: Texas Instruments Auditorium (Building E Visitor Center), 2900 Semiconductor Dr, Santa Clara, CA 95051 |
October 2016 |
Nov 3rd, 2016 | CPI stress induced carrier mobility shift in advanced silicon nodes Sponsored by: IEEE SCV Reliability Chapter, Co-sponsored by IEEE Electron Devices Society SCV Chapter
Time: Thursday, Nov 3, 2016, 6:00 PM to 8:00 PM Speaker: Dr. Valeriy Sukharev, Technical Lead at the Design to Silicon Division (Calibre) of Mentor Graphics Corporation Location: Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 (Meeting will be in the cafeteria, Building B) |
June 2016 | |
June 21st, 2016 | Transforming Nanodevices to Nanosystems Sponsored by: IEEE SF Bay Area Nanotechnology Council, Co-sponsored by IEEE Electron Devices Society SCV Chapter
Time: Tuesday, June 21st, 2016, 11:30 am- 1:00 pm Speaker: Max M. Shulaker, Stanford University Location: Texas Instruments (TI) Auditorium E-1 |
May 2013 | |
May 7th, 2013 | Semiconductor Laser Reliability and Failure AnalysisSponsored by: IEEE Photonics Society Santa Clara Valley ChapterCo-sponsored by IEEE Electron Devices Society SCV Chapter and IEEE Reliability Society SCV Chapter
Time: Tuesday, May 7th, 2013, 6pm-8:30pm
Speaker: Dr. Robert W. Herrick, INTEL
Location: Cogswell College (N.B. New Location–“Dragon’s Den” rm.) 1175 Bordeaux Dr, Sunnyvale, CA 94089 (Location: Between Moffett Park Drive and Java Drive) |
November 2012 | |
Nov. 13, 2012 | NanoMEMSSponsored by: IEEE San Francisco Bay Area Nanotechnology CouncilCo-sponsored by IEEE Electron Devices Society SCV Chapter
Time: Tuesday, November 13, 2012 Noon-1PM
Speaker: Dr. Héctor J. De Los Santos, NanoMEMS Research, LLC, Irvine, Ca
Location: TI Auditorium E-1, 2900 Semiconductor Drive. Santa Clara |
October 2012 | |
Oct. 25, 2012 | Fourth Annual IEEE-SCV Soft Error Rate (SER) WorkshopSponsored by: Cisco Systems, Inc.and the CPMT, Electron Devices, and Reliability chapters of IEEE, Santa Clara Valley
Chair: Peng Su, Ph.D., Component Quality and Technology Group, Cisco Systems, Inc.
Program Chairs: Shi-Jie Wen and Rick Wong, Cisco Systems, Inc. On the campus of Cisco Systems: Building 15, First Floor (Sunken Treasures Conference Room), 3750 Cisco Way, San Jose
Also broadcast LIVE on the Internet, via WebEx (same registration procedure)
Cost: Free; Advance registration required |
IEEE Santa Clara Valley (SCV) Electron Devices Society (EDS) Annual Presentation: General Information & Membership Benefits
Please click here to view the presentation slides.