10th Annual IEEE EPS SCV Soft Error Rate (SER) Workshop

Wednesday, October 24, 2018 (Talk proposals due Sept 12, 2018)

With our Workshop’s focus on alpha-induced soft errors and its unique offering of simultaneous on-site and remote participation, we provide opportunities for interactive discussion on a variety of critical subjects on SER for an ever-increasing international audience.
For this year’s event, we will continue with the format used in the previous two years: We will be inviting industry experts in the field to offer technical presentations and tutorials on fundamentals of soft errors and their impact on applications, as well as selected submitted proposals.
Topics of interest include, but are not limited to:  Impact of soft error rates/mechanisms on commercial/terrestrial applications

  •  Advanced silicon nodes and device SER performance assessment
  • Techniques and approaches for alpha emissivity measurement
  • Success stories of alpha emission or soft error control
  •  Wafer and assembly process control and monitor

Each talk will be limited to 35 minutes, with an additional 5 minutes for questions. The final presentation must be submitted one week before the event, and will be posted as PDF for download after the event. Although new content is especially appreciated, adaptation of content recently published elsewhere is welcome.
The deadline for technical presentations and tutorial abstracts is September 12, 2018. For additional information and a preliminary list of talks, please visit:

10th Annual IEEE EPS SCV Soft Error Rate (SER) Workshop

If you have any questions on this event, or wish to discuss a proposed talk, please email us:

Eric Crabill, Xilinx, at ser_workshop@xilinx.com