Reliability Engineering Testing Methodology and Statistical Knowledge for Qualifications of Consumer Products and Automotive Components
Director of Quality and Reliability, Lumileds
Wednesday, July 17, 2019
Consumer electronic devices and today’s fast growing automotive industry continue to demand ever-higher product and component reliability. This tutorial will provide an overview of reliability testing methodology and statistical knowledge for qualification of consumer products and automotive components. The reliability testing management system including various Rel testing methods and its application to product development at different phases will be first introduced. Some important statistic/probabilistic concepts including uncertainty and how to minimize/deal with it will be discussed. Then the tutorial will focus on physics of failure (PoF) based acceleration life models for consumer products and automotive components Rel testing failures. A typical Rel testing plan based on AEC Q1xx standards for automotive parts, and an example of step-down Rel testing plan for consumer products will be then presented. Finally, some statistical calculation and lifetime prediction examples including 2D stress-strength failure rate determination based on vastly distributed consumer usage conditions will be given.
Fen Chen received his Ph.D. degree in Electrical Engineering in 1998 from University of Delaware. From 1997 to 1998, he was with Intel Component Research at Santa Clara, CA as a graduate intern working on IC interconnect reliability. He joined IBM microelectronics at Essex Junction, VT in 1998 and had worked on semiconductor technology reliability issues until 2015. From 2015 to 2019, he worked for Apple Inc at Cupertino, CA as a senior reliability engineer focusing on various consumer electronic devices. Currently, he is a director of quality and reliability at Lumileds at San Jose, CA responsible for qualifying novel LED MCM products for automotive applications. He holds more than 55 patents and has published over 60 technical papers/invited talks on various journals and conference proceedings.
Food sponsored by I.C.E. Labs, ISO 9001 & 17025 Reliability Test Lab, www.icenginc.comAttendance to this seminar will count towards professional development hours for IEEE, ASQ. Please feel free to forward this message to your friends and colleagues.
Sponsored by IEEE SCV Reliability Chapter
Qualcomm Inc. Building-B Cafeteria
3165 Kifer Road
Santa Clara, CA 95051 United States