Tuesday, January 19, 2016
Noon – 1 pm
Texas Instruments (TI) Auditorium E-1
2900 Semiconductor Drive
Santa Clara, CA
Admission FREE. Please register here.
TITLE: Imaging at Very Short Wavelengths Using Nanotechnology
SPEAKER: Dr. Anne Sakdinawat, SLAC National Accelerator Laboratory
The field of X-ray imaging has not only contributed to a wide range of basic sciences, but also many industries, such as medical imaging, non-destructive testing, and security. Due to the ability to image through thick objects with high resolution and in some cases, with elemental identification and femtosecond time resolution, x-ray imaging in biological, chemical, and physical sciences is a very powerful tool. Examples of this include tomography of whole unstained cells, in-situ nanoscale imaging of battery components with elemental specificity, and imaging of magnetic domains. While sophisticated x-ray instrumentation has been developed for use with synchrotron radiation, translation to lab-based use still remains a challenge. A major goal in x-ray imaging is to be able to develop new lab-based technologies with improved imaging capabilities that currently exist at synchrotrons.
Dr. Anne Sakdinawat is currently a scientist at SLAC National Accelerator Laboratory where she serves as a group leader in x-ray optics and imaging. Her research interests include the development of new x-ray imaging, optics, nanofabrication techniques and translational research for biomedical and materials applications. She received her doctorate in bioengineering from the University of California at Berkeley and San Francisco and has received the Werner Meyer-Ilse Award for Excellence in X-ray Microscopy and the Department of Energy Early Career Award.
- 11:30 am – Registration & light lunch (pizza & drinks)
- Noon – Presentation & Questions/Answers
- 1:00 pm – Adjourn