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Radiation hardness and accelerated testing of electronics

May 17 @ 10:00 - 12:00

Reliability needs for electronics is steadily increasing and radiation is one important source for failures in electronic systems, both in space and in terrestrial environments. The workshop will address this issue and present methods to test electronics for radiation hardness and also highlight the introduction of wide bandgap semiconductors, which are inherently more radiation hard than prevailing silicon.

     

Program (updated 20190509):

10.00-10.20 Coffee

10.20-10.40 Radiation problems for Electronics, S. S. Suvanam, ÅAC Microtec

10.40-11.00 Neutron facilities and standards for accelerated testing of electronics, Alexander Prokofiev, UU

11.00-11.20 The emerging NESSA neutron facility at Uppsala University, Erik Andersson Sundén, UU

11.20-11.40 Radiation hardness of wide bandgap semiconductors, A. Hallén, KTH

11.40-           Discussion

Details

Date:
May 17
Time:
10:00 - 12:00

Venue

KTH EECS Room 205
Kistagången 16
Kista, Stockholm 16440

Organizer

IEEE ED Chapter