IEEE Transactions on Nanotechnology
IEEE

Archive for January, 2015

Special Section on “Nanotechnology for Instrumentation and Measurement”

Friday, January 23rd, 2015

The IEEE Transactions on Nanotechnology seek original manuscripts for a Special Section on Nanotechnology for Instrumentation and Measurement

Background and Scope

Instrumentation and measurement are of importance when characterizing, testing and employing novel
devices and materials. These areas assume a particular importance at the “nano” scales in which electrical
and physical quantities encounter new challenges. The proposed special section will be comprised of high
impact papers with particular emphasis on the application area of instrumentation and measurement and
its relation to nanotechnology. Original research contributions and review papers, not limited to the ones
presented at nanofim2015, are sought including (but not limited to) the following topics:

• General and dedicated devices
• Nanoimaging
• Metrology, reliability and testing
• Nanotechnology and plasma
• Environmental applications
• Automotive
• Nanomedicine
• Nanoptics and Nanophotonics
• Networking
• Bio-molecular and Biotechnology
• Aeronautics and aerospace
• Fabrication and characterization of sensors and transducers
• Signal and image processing
• General and ad hoc instrumentation
• Biomedical applications
• Industrial applications
• Mechatronics
• Light and lightning
• Packaging and Nanomaterials
• Modeling
• Energy

Submission Format

Extended versions of accepted and presented papers at Nanofim2015 (http://nanofim2015.unisalento.it) are
encouraged but they will still undergo the peer review process; authors for this Special Section are requested
to expand the workshop version to contain at least 40% new material. All manuscripts must be submitted on-
line using the IEEE TNANO manuscript template and Information for Authors, via the IEEE Manuscript
Central found at https://mc.manuscriptcentral.com/tnano. On submission, authors must select the “Special Issue” manuscript type instead of “Regular Paper.” Manuscripts must focus on nanotechnology for
instrumentation and measurement as reflected by technical content and references.

Important Dates

Paper submission: October 1, 2015
Acceptance notification: December 15, 2015
Revision due (if necessary): February 1, 2016
Final notification (acceptance/rejection): March 1, 2016
Final manuscripts due: March 30, 2016
Special section publication: 5th issue of 2016

Guest Editors

Aimé Lay-Ekuakille
Università del Salento, Italy
E-mail: aime.lay.ekuakille@unisalento.it

Wen J. Li
City University of Hong Kong, Hong Kong
E-mail: wenjli@cityu.edu.hk

Flyer

Downloadable Call for Papers pdf.

Extended deadline for the TC/TNANO Joint Special Section on DFT

Monday, January 12th, 2015

The deadline for submission to the TC/TNANO Joint Special Section on Defect and Fault Tolerance in VLSI and Nanotechnology Systems has been extended to February 1, 2015.
More information on this special issue are available here.